From: Effect of Surface Roughness in Micro-nano Scale on Slotted Waveguide Arrays in Ku-band
Methods | Indexes | Region S1 | Region S2 | Region S3 |
---|---|---|---|---|
Measurement | Ra/mm | 0.495 | 1.477 | 0.703 |
Rl/mm | 0.874 | 3.453 | 1.367 | |
EC model | Ra/mm | 0.508 | 1.501 | 0.635 |
Rl/mm | 0.970 | 3.415 | 1.248 |