From: Design of Accelerated Life Test Plans—Overview and Prospect
Essentials of optimization model | Model and method proposed by Nelson et al. [7, 8, 14,15,16,17,18,19] | Extended researches | ||
---|---|---|---|---|
Test purpose | To estimate the pth quantile y p (0) of lifetime under normal stress | To estimate multiple quantiles [20,21,22]; for acceptance of product [23, 24]; to select the optimal product [25]; to estimate the quantile of the different products under normal stress [26]; to estimate the other parameters [27,28,29,30] | ||
Test forms | Type of test censoring | Type-I censoring | Failure censored [23, 25, 31, 32]; time failure mixed censored [33] | |
Data collection method | Continuous testing | |||
Strategy for testing the samples | All samples are put in from the start. | |||
Number of stress levels | Singe stress level | Double or multiple stress levels [44,45,46,47,48,49,50,51,52,53,54,55] | ||
Statistical models | Failure mode | Single failure mode | ||
Types of life distribution | Weibull/lognormal distribution | Two parameter exponential distribution [56]; Rayleigh distribution [36]; Burry type XII [38]; nonparametric method [27, 57] | ||
Parameters relating to stress | Location parameter of location- scale distribution | Location and scale parameter of location-scale distribution [24, 58] | ||
Form of stress-life relationship | Linear function | |||
Data form | Life data | |||
Data analysis method | MLE | |||
Optimal design models of test plan | Optimization objective | Minimize the asymptotic variance of estimated y p (0) | Multi-objective [20,21,22, 26, 27, 61,62,63,64,65,66,67,68]; cost [68]; test time [65, 66]; D-optimal [28, 29, 48, 69]; minimax [70]; robustness [21, 64]; highest stress [71]; others [27, 30] | |
Design Variables | Stress level | Minimum stress | ||
Allocation of sample size | Proportion in which samples are allocated to the lowest stress level. | Proportion in which samples are allocated to the intermediate stress level [27, 57, 65,66,67,68, 72, 73] | ||
Allocation of test time | Not optimized | Optimize test time allocated to each stress level [65, 66, 68] | ||
Constraints | Total sample size | Large sample size | Limited sample size [74] | |
Total test time | Specify the censoring time allocated to each stress level | Specify the total test time [68] | ||
Space between stress levels | Unconstrained/Equal difference | Unequal difference [21, 27, 34, 36, 57, 63, 64, 66,67,68, 70, 72, 73] | ||
Allocation of sample size | Unconstrained/equal allocation/Specified proportion | Minimize the expected number of failures [27, 39, 57, 66,67,68, 74] | ||
Allocation of test time | Equal | |||
Other | / | Acceleration factor [49]; probability of failure at each stress level [65, 67, 72, 73], etc. |