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Table 3 Evolution of tool condition monitoring

From: Advanced Data Collection and Analysis in Data-Driven Manufacturing Process

Year

Indirect monitoring

Direct monitoring

Before 2000

Accelerometer [65]

Radioactive sensor [61]

Proximity sensor [60]

Structured light [62]

2001–2010

Current sensor [66,67,68]

3D metrology [72]

2011–2020

AE sensor [64]

Surface roughness inspector [69]

Dynamometer [63]

2D vision [70]

3D vision [71]

Infrared thermography [73]

Integrated vision system [74]