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Table 3 Evolution of tool condition monitoring

From: Advanced Data Collection and Analysis in Data-Driven Manufacturing Process

Year Indirect monitoring Direct monitoring
Before 2000 Accelerometer [65] Radioactive sensor [61]
Proximity sensor [60]
Structured light [62]
2001–2010 Current sensor [66,67,68] 3D metrology [72]
2011–2020 AE sensor [64]
Surface roughness inspector [69]
Dynamometer [63]
2D vision [70]
3D vision [71]
Infrared thermography [73]
Integrated vision system [74]