From: Effect of Thermal Cyclic Loading on Stress-Strain Response and Fatigue Life of 3D Chip Stacking Structure
Control factors
Level 1
Level 2
Level 3
A
IMC
Cu6Sn5
Cu3Sn
N3Sn4
B
High Temperature (K)
423
398
373
C
Low Temperature (K)
233
218
213
D
Dwell time (min)
15
12.5
10