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Table 2 Product and testing machine information

From: A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation Problem

Workshop

Product

Testing time (and interface quantity

constraint) at stage 1

Testing time (and interface quantity

constraint) at stage 2

 

(a) Testing time (and interface quantity constraint) of products at various stages

 

 W1

A2T2R

5 (1)

10 (1)

 

A2T4R

3 (2)

3 (2)

 

 W2

B2T2R

2 (1)

4 (1)

 

B2T4R

3 (2)

3 (2)

 

Machine

Matching stage

Interface quantity

Workshop

Quantity

(b) Available machines in workshops

 M1

S1

1

W1

1

   

W2

1

 M2

S1

2

W1

0

   

W2

2

 M3

S2

1

W1

2

   

W2

2

 M4

S2

2

W1

2

   

W2

4

Workshop

Distance from W1 (km)

Distance from W2 (km)

  

(c) Distance between workshops

 W1

0.5

1

  

 W2

1

0.5

 Â